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Journal of Electron Microscopy 46(1): 11-22 (1997)
© 1997 Oxford University Press

Multiple beam tilt microscopy for super resolved imaging

A. I. Kirkland*, W. O. Saxton1 and G. Chand2

Department of Chemistry, Lensfield Road Cambridge CB2 1EW JEOL (UK) Ltd, JEOL House, Silvercourt, Watchmead, Welwyn Garden City, Herts AL7 1IT
1Department of Materials Science and Metallurgy Pembroke Street, Cambridge CB2 3QZ
2Department of Engineering, Trumpington Street, Cambridge CB2 1PZ UK

*To whom correspondence should be addressed

In this paper we report a super-resolved reconstruction of a thin crystal of H-Nb2O5 in which the limit of continuous transfer has been extended from about 0.2 nm in the conventional axial image to 0.13 nm. To allow the reconstruction of crystalline fragments containing little stable amorphous material, modifications to the standard procedure for image registration have been developed. Both the modulus and phase of the reconstruction appear to contain directly interpretable information.

Keywords     super resolution,, image reconstruction

Received     20 September 1996, accepted 28 October 1996


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