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Journal of Electron Microscopy 46(1): 67-74 (1997)
© 1997 Oxford University Press

Structure of a stacking fault in the (||101) plane of TiO 2

Susumu Yamada1 and Michiyoshi Tanaka

Research Institute for Scientific Measurements, Tohoku University 2-2-1 Katahira, Aoba-ku, Sendai 980, Japan

The defocus convergent-beam electron diffraction method has been used for the determination of the displacement vector of a stacking fault in the (||101) plane of TIO2. The displacement vector has been determined to be [||0.25 ± 0.00, 0.00±0.03, ||0.27±0.01]. High-resolution electron microscope (HREM) images show that there is a relaxation of the lattice with a width of about 1 nm around the fault. A structural modelof the fault with a relaxation is proposed, which explains the HREM images well.

Keywords     convergent-beam electron diffraction (CBED),, high-resolution electron microscope (HREM) image,, HREM image simulation,, TiO2 (rutile),, stacking fault,, relaxation of the lattice

Received     15 August 1996, accepted 28 October 1996


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