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Journal of Electron Microscopy 47(5): 433-442 (1998)
© 1998 Oxford University Press

Time-resolved observation in transmission electron microscopy by means of spatially resolved electron correlation spectroscopy

Nobuyuki Osakabe*, Tetsuji Kodama1, Tsuneyuki Urakami2, Shinji Ohsuka2, Hiroshi Tsuchiya2, Yutaka Tsuchiya2, Junji Endo and Akira Tonomura

Advanced Research Laboratory Hitachi Ltd, Hatoyama, Saitama 350–0395, Japan
1Department of Information Electronics, Faculty of Engineering, Nagoya University Nagoya 464-8603, Japan
2Central Research Laboratory, Hamamatsu Photonics 5000 Hirakuchi, Hamakita 434-0041, Japan

*To whom correspondence should be sent. E-mail: osakabe{at}harl.hitachi.co.jp

Time-resolved electron microscopy incorporation electron counting and electron correlation spectroscopy can be used to quantify the dynamics in materials faster than the shot noise limit. An imaging electron beam current, temporally modulated by the dynamics of the specimen, is selected by the aperture in the image plane and measured by means of an electron counting technique. Silicon avalanche photodiodes are ideal for detecting electrons because of their fast response (rise time <200 ps) and small dead time (<500 ps). A flipped digital correlator with 128 delay channels working at a clock frequency of 30 MHz is developed and successfully used for measuring the autocorrelation function of the time-dependent image beam current (electron correlation spectroscopy). Applications of this method to the study of the dynamics of superconducting vortices and to the observation of nanovibrations of materials associated with elastic properties are discussed.

Keywords     digital correlator, avalanche photodiode, time-resolved, transmission electron microscope, electron counting

Received      2 April 1998, accepted 26 June 1998


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