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Journal of Electron Microscopy 48(1): 35-37 (1999)
© 1999 Oxford University Press

Evaluation of image drift correction by three-dimensional Fourier analysis

Tadahiro Kawasaki, Hidetoshi Utsuro, Yoshizo Takai and Ryuichi Shimizu

Department of Applied Physics, Faculty of Engineering, Osaka University Yamada-oka 2-1, Suita, Osaka 565-0871 Japan E-mail: kawasaki{at}ap.eng.osaka-u.ac.jp

The cross-correlation function has been applied to correct linear and random image drifts included in a through-focus series of images. A novel method based on three-dimensional Fourier analysis is proposed to evaluate how precisely the image drift correction is performed for the images. The linear and random drifts remaining after the correction are evaluated to be negligibly small by measuring the inclination and the sharpness appearing in the three-dimensional power spectrum.

Keywords     transmission electron microscope, through-focus series, cross-correlation function, image drift correction, three-dimensional power spectrum, Fourier analysis

Received     11 May 1998, accepted 17 September 1998


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