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Journal of Electron Microscopy 48(5): 471-480 (1999)
© 1999 Oxford University Press

The importance and applications of ultra-high voltage electron microscopy to materials science

Hiroshi Fujita

Professor Emeritus of Osaka University 5-12-22 Yamatedai, Ibaraki-shi, Osaka 567-0009, Japan

In natural science there is ‘the threshold value’, above which a new world is opened. Electron channelling occurring at ultra-high voltages is a typical example. Since 1963–65, high voltage electron microscopes and their related accessories have been developed and widely applied to materials science. Insitu experiments have been carried out with these electron microscopes on various phenomena and their mechanisms have been made clear in detail. New research fields induced by high energy electron irradiation have also been developed with ultra-high voltage electron microscopes, and new functional materials such as non-equilibrium phases have been formed in situ. The present account deals with the epoch-making utility of ultra-high voltage electron microscopy and its indispensable applications to the aforementioned new research fields in materials science.

Keywords     eletron channelling, in-situ experiment, electron irradiation induced phenomena, crystalline-amorphous transition, foreign atom implantation, atom cluster

Received     16 October 1998, accepted 16 March 1999


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