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Journal of Electron Microscopy 48(5): 601-603 (1999)
© 1999 Oxford University Press

Electron diffraction of polysiloxane-bound metal complexes using energy-filtered transmission electron microscopy (EFTEM)

Fang Zhou, Erich Plies*, Fritz Keller1 and Volker Schurig1

Institut för Angewandte Physik
1Institut för Organische Chemie, Universität Töbingen Auf der Morgenstelle 10, D-72076 Töbingen, Germany

*To whom correspondence should be addressed. E-mail: erich.plies{at}uni-tuebingen.de

By means of specimen shifting and zero-loss energy filtering using an energy-filtering transmission electron microscope, main amorphous halos with the centre corresponding to 0.7 nm are recorded from thin films of a polysioxane bound UO22{boxplus} -complex as well as a polysioxane-bound Eu3{boxplus} -complex at room temperature. Furthermore, electron diffraction patterns measured at low temperatures around 100 K show that the thin film of polysiloxane bound UO22{boxplus} -complex becomes polycrystalline. These results show some analogy to the results of X-ray investigation [Andeianov K A et al. (1972) J. Polymer Sci. Part Al 10: 1—22] of the linear polydimethylsiloxane without binding metal-complex.

Keywords     EFTEM, ESD, cryo accessories, polysioxane-bound metal complex

Received     25 October 1998, accepted 31 May 1999


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