Skip Navigation

This Article
Right arrow Full Text (PDF)
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Email this article to a friend
Right arrow Similar articles in this journal
Right arrow Alert me to new issues of the journal
Right arrow Add to My Personal Archive
Right arrow Download to citation manager
Right arrowRequest Permissions
Google Scholar
Right arrow Articles by Tozawa, K.
Right arrow Articles by Takahashi, H.
Right arrow Search for Related Content
PubMed
Right arrow Articles by Tozawa, K.
Right arrow Articles by Takahashi, H.
Social Bookmarking
Add to CiteULike   Add to Connotea   Add to Del.icio.us  
What's this?

Journal of Electron Microscopy 48(5): 613-616 (1999)
© 1999 Oxford University Press

Nano-crystalline formation during stress-induced amorphization at crack tips in TiNi

K. Tozawa1, Y. Haishi1, Y. Matsukawa1, S. Watanabe1, S. Ohnuki1 and H. Takahashi2

1Divsion of Materials Science, Graduate School of Engineering Sapporo 060-8628, Japan
2Center for Advanced Research of Energy Technology, Hokkaido University Sapporo 060-8628, Japan

Although the local stress intensification in the immediate vicinity of a crackat room temperature was also carried out. Local stress-induced amorphization at moving crack tips has been observed. The HREM observation with a 200 kV FE-TEM revealed nano-crystalline formation in the intermediate region between the amorphous region and the crystalline region.

Keywords     nano-crystalline, stress-inducted amorphization, crack tip, high-voltage electron microscopy, high-resolution electron microscopy

Received      7 April 1999, accepted 3 July 1999


Add to CiteULike CiteULike   Add to Connotea Connotea   Add to Del.icio.us Del.icio.us    What's this?




Disclaimer: Please note that abstracts for content published before 1996 were created through digital scanning and may therefore not exactly replicate the text of the original print issues. All efforts have been made to ensure accuracy, but the Publisher will not be held responsible for any remaining inaccuracies. If you require any further clarification, please contact our Customer Services Department.