Skip Navigation

This Article
Right arrow Full Text (PDF)
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Email this article to a friend
Right arrow Similar articles in this journal
Right arrow Similar articles in PubMed
Right arrow Alert me to new issues of the journal
Right arrow Add to My Personal Archive
Right arrow Download to citation manager
Right arrowRequest Permissions
Google Scholar
Right arrow Articles by Onozuka, T.
Right arrow Articles by Nagakura, S.
Right arrow Search for Related Content
PubMed
Right arrow PubMed Citation
Right arrow Articles by Onozuka, T.
Right arrow Articles by Nagakura, S.
Social Bookmarking
Add to CiteULike   Add to Connotea   Add to Del.icio.us  
What's this?

Journal of Electron Microscopy 49(1): 149-155 (2000)
© 2000 Oxford University Press

Atomic displacements in the modulated structure of Bi2Sr2(Ca1-XPrX)Cu2O8+{delta} and their effect on HRTEM reverse contrast image

Takashi Onozuka and Sigemaro Nagakura1

Niigata Institute of Technology 1719 Fujihashi, Kashiwazaki 945-1195
1Laboatory of Materials Science and Technology, Waseda University Nishiwaseda, Shinjuku-ku, Tokyo 169-0051, Japan

The amplitude of transverse atomic displacement wave along the direction of incident electron beam exerts a significant effect on the brightness of spots in a high-resolution transmission electron microscope (HRTEM) reverse contrast image. The bright spot is associated with the projection of the modulated atomic chain along the beam direction. In general, the spot brightness is roughly inversely proportional to the amplitude of the displacement wave in an appropriate region of defocus, specimen thickness and amplitude. Monotonic decrease in the spot brightness with increasing amplitude can be attributed to the decrease in the degree of interference between scattered elearons. A complicated domain configuration has been found by the analysis of the spot brightness modulation observed in a [00 1] HRTEM reverse contrast image.

Keywords     HRTEM, reverse contrast image, contrast modulation, atomic displacement wave, phase difference, Bi2Sr2(Ca0.96Pr0.04)Cu2O8+{delta}

Received     25 May 1999, accepted 1 November 1999


Add to CiteULike CiteULike   Add to Connotea Connotea   Add to Del.icio.us Del.icio.us    What's this?




Disclaimer: Please note that abstracts for content published before 1996 were created through digital scanning and may therefore not exactly replicate the text of the original print issues. All efforts have been made to ensure accuracy, but the Publisher will not be held responsible for any remaining inaccuracies. If you require any further clarification, please contact our Customer Services Department.