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Journal of Electron Microscopy 49(1): 173-177 (2000)
© 2000 Oxford University Press

Plan-view imaging of oxygen-induced reconstruction on Ag(110) surface. II. Effect of high-energy electron thinning

Shu-You Li1,2,3, Jing Zhu1,* and Heng-Qiang Ye2

1Electron Microscopy Laboratory, School of Materials Science and Engineering, Tsinghua University Beijing 100084
2Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Chinese Academy of Sciences Shenyang 110015, People's Republic of China

*To whom correspondence should be sent. Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, People's Republic of China. E-mail: jzhu{at}mail.tsinghua.edu.cn

The feasibility and the limitation of the ‘high-energy electron thinning’ method for the production of surface-science-grade samples in situ in the electron microscope are studied. Exploiting the electron beam supplied by high-voltage electron gun in electron microscope, this method can be readily realized. An obvious advantage of this method is that we can monitor the sample surface concurrently. However, this sample preparation method depends strongly on the sample material and the local environment within the electron microscope. Factors relating to the electron thinning speed are briefly discussed.

Keywords     transmission electron microscopy, plan-view imaging of surfaces, sample preparation, electron-solid interaction

Received     28 September 1998, accepted 6 December 1999


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