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Journal of Electron Microscopy 49(1): 179-183 (2000)
© 2000 Oxford University Press

Simulation of the effect of magnification and image-rotation variations on three-dimensional reconstruction

Haibo Zhang1,*, Aiichiro Kashiwagi2 and Akio Takaoka2

1School of Electronic and Information Engineering, Xi'an Jiaotong University Xi'an 710049, People's Republic of China
2Research Center for Ultra-HVEM, Osaka University Yamada-oka 2-1, Suita, Osaka 565-0871, Japan

*To whom correspondence should be addressed. E-mail: hbzhang{at}xjtu.edu.cn

Tilting a specimen may change the magnification and the image rotation for electron-microscopic images, because re-focusing with an objective lens is required to correct for the height variation of the tilted specimen. Computer simulation is performed to analyse the effect of variations in the magnification and the image rotation on the three-dimensional reconstruction in electron tomography.

Keywords     magnification, image rotation, specimen tilt, three-dimensional reconstruction, electron microscopy

Received      3 August 1999, accepted 30 September 1999


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