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Journal of Electron Microscopy 49(1): 31-39 (2000)
© 2000 Oxford University Press

High precision phase-shifting electron holography

Kazuo Yamamoto*, Ikuo Kawajiri, Takayoshi Tanji1, Michio Hibino1 and Tsukasa Hirayama2

Department of Elearonics Furo-cho, Chikusa-ku, Nagoya 464-8603
1Center for Integrated Research in Science & Engineering, Nagoya University Furo-cho, Chikusa-ku, Nagoya 464-8603
2Japan Fine Ceramics Center 2-4-1 Mutsuno, Atsuta-ku, Nagoya 456-0023, Japan

*To whom correspondence should be addressed

Today's information-oriented society requires high density and high quality magnetic recording media. The quantitative observation of fine magnetic structures by electron holography is greatly anticipated in the development of such new recording materials. However, the magnetic fields around particles <50 nm have not been observed, because the fields are too weak to observe in the usual way. Here we present a highly precise phase measurement technique: improved phase-shifting electron holography. Using this method, the electric field around a charged polystyrene latex particle (100 nm in diameter) and the magnetic field around iron particles (30 nm in diameter) are observed precisely. A precision of the reconstructed phase image of 2{pi}/300 rad is achieved in the image of the latex particle.

Keywords     phase-shifting electron holography, highly precise phase measurement technique, Fresnel correction, weak electric fields, weak magnetic fields

Received     11 December 1998, accepted 4 June 1999


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