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Journal of Electron Microscopy 49(1): 61-65 (2000)
© 2000 Oxford University Press

Bloch waves and weak-beam imaging of crystals

Helge Heinrich and Gernot Kostorz

ETH Zürich, Institut für Angewandte Physik CH-8093 Zürich, Switzerland

The influence of the number of diffracted beams on weak-beam contrast simulations of thickness contour lines and dislocation images is investigated. For large deviation parameters sg-> thickness contour lines from two-beam simulations are similar to those from many-beam simulations. In many-beam simulations of wedge-shaped bent samples extra thickness contour lines appear at locations with (g->, 3g->). These extra lines occur between the imaging condition (g->,-g->) and (g->, 3g->). Therefore, in the case of a more symmetrical imaging condition many-beam simulations are mandatory. In bent samples the contributions of different Bloch waves to weak-beam images change as a function of the imaging conditions (g->, xg->). Near (g->, 3.5 g->) two Bloch waves dominate. In the case of x <3 two other Bloch waves with different wavelengths are most important for the image contrast. The ‘classical’ (g->, 3g->) weak-beam condition is not suitable to determine signs and magnitudes of Burgers vectors from terminating thickness contour lines. Higher deviation parameters sg-> are necessary, especially for dense dislocation arrangements.

Keywords     transmission electron microscopy, Bloch waves, weak-beam imaging, thickness contour lines, bending

Received     11 December 1998, accepted 26 October 1999


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