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Journal of Electron Microscopy 49(1): 89-92 (2000)
© 2000 Oxford University Press

Characterization of lattice defects in strontium titanate single crystals by X-ray topography and transmission electron microscopy

Junji Yamanaka*, Jun-ichi Yoshimura and Shiushichi Kimura

Institute of Inorganic Synthesis, Faculty of Engineering, Yamanashi University 7 Miyamae-cho, Kofu 400-8511, Japan

*To whom correspondence should be addressed. E-mail: jyamanak{at}ccn.yamanashi.ac.jp

Lattice defects in SrTiO3 single crystals were characterized by X-ray topography and transmission electron microscopy. We examined two groups of crystals whose lapped faces were (001) and (011), respectively. After taking X-ray topographs, crystals which included relatively many defects were chosen for detailed investigation by transmission electron microscopy, which gave the following results: (i) some subgrain boundaries observed by X-ray topography were small-angle tilt boundaries; and (ii) many dislocations were found in the region where thick line contrast was observed in X-ray topographs. Most of them had <100> type Burgers vectors.

Keywords     transmission electron microscopy, X-ray topography, SrTiO3, Burgers vector, dislocation

Received     11 December 1998, accepted 11 May 1999


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