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Journal of Electron Microscopy 50:509-515 (2001)
© 2001 Oxford University Press

Paper

Advances in energy-filtering transmission electron microscopy

Wilfried Sigle, Achim Zern, Kersten Hahn, Ulrike Eigenthaler and Manfred Rühle

Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174 Stuttgart, Germany

First experiments using a new energy-filtering microscope (Sub-eV-Sub-Å microscope, or SESAM) are shown. They make use of the high transmissivity of the 90° filter. This allows the mapping of chemical bonding of large specimen areas, even if narrow energy selecting slits are used. Because large scattering angles are accepted by this filter, energy-filtered diffraction patterns extending to 150 mrad can be recorded by a single exposure. This can be used to determine the reduced density function of amorphous materials and reduces the exposure time of the investigated area by three orders of magnitude as compared with previous approaches.

Keywords     energy-filtering transmission electron microscopy (EFTEM), bond mapping, amorphous materials, reduced density function, aberration correction, electron diffraction


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