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Journal of Electron Microscopy 51:S271-S278 (2002)
© 2002 Oxford University Press

Full-length paper

Characterization of the microstructure in CMR materials by HREM

D. X. Li, M. G. Wang and H. Q. Ye

Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110015, China

To whom correspondence should be addressed. E-mail: dxli{at}imr.ac.cn

The microstructures of La0.7Ca0.3MnO3 (LCMO) and La1.0Nd0.2Sr1.8Mn2O7 (LNSMO) bulk materials, LCMO thin films prepared by different methods, and LCMO/Gd0.7Ca0.3MnO3 (GCMO) multilayers have been studied by high-resolution electron microscopy. Twins and microdomains in the LCMO bulk materials as well as the intergrowth structure, (101) crystal shear structure, and a complex defect structure in LNSMO bulk materials were observed. The displacement of oxygen ion in LCMO films grown on LaAlO3 (LAO) by pulsed laser deposition (PLD) method induces the structure transformation from orthorhombic to monoclinic. The evolution of strain in LCMO films prepared by reactive sputtering (RS) method on both LAO and SrTiO3 substrates was studied as a function of film thickness. The distribution and size of oriented domains observed in LCMO films prepared by RS were different from those prepared by PLD. The inner strains exist in LCMO and GCMO layers, which might result in lower TM and larger resistivity maximum in LCMO/GCMO multilayers.

Keywords     HREM, CMR materials, defect, microdomain, strain, interface


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