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Journal of Electron Microscopy 51:S79-S85 (2002)
© 2002 Oxford University Press

Full-length paper

Measuring the Young's modulus of solid nanowires by in situ TEM

Zhong Lin Wang1,*, Zu Rong Dai1, Ruiping Gao1 and James L. Gole2

1School of Materials Science and Engineering and
2School of Physics, Georgia Institute of Technology, Atlanta, GA 30332-0245-0430, USA

To whom correspondence should be addressed. E-mail: zhong.wang{at}mse.gatech.edu

Property measurements of individual nanowires are challenging due to the small sizes of the structures. Scanning probe microscopy has thus far been the dominant tool for the characterization of nanomaterial properties. We have developed an alternative novel approach that allows a direct measurement of the mechanical properties of individual nanowires by in situ transmission electron microscopy (TEM). The technique relies on the electric field induced mechanical resonance of the nanowire observed in TEM, as it directly correlates the atomic-scale microstructure of the nanowire with its physical properties. In this paper, the measurement of Young's modulus for composite SiO2/SiC wires is reported. The experimental results are in agreement with theoretically expected values.

Keywords     nanotube, nanowire, in-situ TEM, Young's modulus


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