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Journal of Electron Microscopy Advance Access originally published online on September 7, 2005
Journal of Electron Microscopy 2005 54(3):299-308; doi:10.1093/jmicro/dfi056
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© The Author 2005. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please email: journals.permissions@oxfordjournals.org

In situ quantitative analysis of etching process of human teeth by atomic force microscopy

Fumio Watari*

Biomedical, Dental Materials and Engineering, Department of Oral Health Science, Graduate School of Dental Medicine, Hokkaido University, Kita 13 Nishi 7, Kita-ku, Sapporo 060-8586, Japan

* E-mail: watari{at}den.hokudai.ac.jp

Etching is one of the most fundamental steps in the restoration of teeth by adhesion of composite resin in dental clinics. Atomic force microscope (AFM) was used for the in situ observation of the etching process of human enamel, dentin and synthetic hydroxyapatite in the three different acid agents, 2% phosphoric acid, 10% citric acid and 10% polyacrylic acid. To measure the absolute depth from the initial level before etching and to correlate the surface height between the changing AFM images obtained, the depth profiles were recorded with etching time by carrying out the line scan consecutively at the representative place of the observed area. These chronological series of depth profiles enabled us to perform quantitative analysis of etched amount in addition to the surface roughness obtained from relative depth profile within one image. The course of etching process from the dissolution of smear layer, appearance of enamel prizms or dentinal tubules to progress of demineralization could clearly be observed. The depth profile, surface roughness, etching amount, etching rate and smear layer thickness could then be evaluated. The different etching characteristics of three acid agents and the effect of surface roughness produced by different mechanical prepolish were compared and discussed.

Keywords     atomic force microscope, in situ observation, tooth, etching, surface roughness, smear layer

Received     16 March 2005, accepted 15 July 2005


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