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Journal of Electron Microscopy Advance Access originally published online on September 5, 2005
Journal of Electron Microscopy 2005 54(4):373-377; doi:10.1093/jmicro/dfi060
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© The Author 2005. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please email: journals.permissions@oxfordjournals.org

Dark-field transmission electron microscopy for a tilt series of ordering alloys: toward electron tomography

Kousuke Kimura1, Satoshi Hata1,*, Syo Matsumura2 and Takao Horiuchi2

1 Department of Applied Science for Electronics and Materials, Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Kasuga 816-8580, Japan and 2 Department of Applied Quantum Physics and Nuclear Engineering, Graduate School of Engineering, Kyushu University, Fukuoka 812-8581, Japan

* To whom correspondence should be addressed. E-mail: hata{at}asem.kyushu-u.ac.jp

Here we show a technique to obtain a tilt series of dark-field (DF) transmission electron microscopy (TEM) images in ordering alloys for tomographic three-dimensional (3D) observations. A tilt series of DF TEM images of D1a-ordered Ni4Mo precipitates in a Ni–Mo alloy was successfully obtained by adjusting a diffraction condition for a superlattice reflection from the Ni4Mo precipitates. Since the superlattice reflection usually has a long extinction distance, dynamic diffraction effects such as thickness fringes can be suppressed to some extent with precise realignment of the diffraction condition. By using the tilt series of the DF TEM images, we attempted a computed TEM tomography to visualize 3D shapes and positions of the precipitates.

Keywords     Dark-field transmission electron microscopy, ordering alloys, Ni4Mo, superlattice reflection, electron tomography

Received     10 June 2005, accepted 2 August 2005


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