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Journal of Electron Microscopy 2005 54(supplement 1):i87-i90; doi:10.1093/jmicro/54.suppl_1.i87
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© The Author 2005. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please email: journals.permissions@oupjournals.org

Article

Nano-sized domains related to dielectric anomaly in YFe2O4-{delta}

Y. Horibe1,*, K. Kishimoto1, S. Mori1 and N. Ikeda2

1 Department of Materials Science, CIAS, Osaka Prefecture University, 1-1 Gakuen-cho, Sakai, Osaka 599-8531, Japan and 2 Japan Synchrotron Radiation Research Institute, Spring-8, 1-1 Koto, Mikazuki, Hyogo 679-5198, Japan

* To whom correspondence should be addressed. E-mail: horibe{at}ms.cias.osakafu-u.ac.jp

Abstract

We examined microstructures related to the charge ordering in YFe2O4-{delta}, by transmission electron microscopy. It is found that two types of characteristic diffuse scatterings appear at room temperature. One is characteristic diffuse streaks elongated along the [0001] direction through the (1/3 1/3 /3 0)-type reciprocal positions and the other is diffuse spots at (1/3 – {eta} 1/3 – {eta} /3 + 2{eta} 0)-type incommensurate positions ({eta} {approx} 0.066). Real-space images revealed that the former diffuse scattering is related to nano-domains due to the charge ordering and the latter one is related to those due to vacancy ordering. The presence of the nano-sized domains should be strongly related to the dielectric anomalies found in YFe2O4-{delta}.

Keywords     RFe2O4, charge ordering, transmission electron microscopy, nano-sized domains

Received      9 August 2004, accepted 15 October 2004


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