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Journal of Electron Microscopy Advance Access originally published online on March 23, 2006
Journal of Electron Microscopy 2006 55(1):13-16; doi:10.1093/jmicro/dfl003
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© The Author 2006. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please email: journals.permissions@oxfordjournals.org

Analysis of ultrastructures in Fe-encapsulating onion-like fullerenes

Xiaomin Wang1,2, Bingshe Xu1,2,*, Xuguang Liu2 and Hideki Ichinose3

1 College of Materials Science and Engineering, Taiyuan University of Technology, Ministry of Education Taiyuan, 030024, P.R.China
2 Key laboratory of Interface Science Engineering in Advanced Materials, Taiyuan University of Technology, Ministry of Education Taiyuan, 030024, P.R.China
3 Center for Advanced Research of Energy Conversion Materials, Hokkaido University KITA-ku

*To whom correspondence should be addressed. E-mail: xubs{at}public.ty.sx.cn

The ultrastructures of Fe-encapsulating onion-like fullerenes (OLFs) synthesized at different temperatures were analyzed by scanning electron microscopy, high-resolution transmission electron microscopy and X-ray diffraction. The results indicate that the structure of OLFs is strongly affected by the growth temperature. In a reaction temperature range of 900–1000°C, the morphology of produces was changed from clew-shaped, tree-shaped to metal encapsulating OLFs. The metal particles encapsulated into OLFs were found to be pure Fe. In some degree, the transformation of ultrastructures shows the formation of Fe-encapsulating OLFs. In the meantime, TEM observation indicated that OLFs grown at higher temperature possess higher degree of graphitization.

Keywords     Fe-encapsulating onion-like fullerenes (OLFs), ultrastructures, TEM, graphitization

Received     19 July 2005, accepted 20 February 2006


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