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Journal of Electron Microscopy Advance Access originally published online on April 5, 2006
Journal of Electron Microscopy 2006 55(1):27-30; doi:10.1093/jmicro/dfl006
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© The Author 2006. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please email: journals.permissions@oxfordjournals.org

Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy

Masaki Taya*, Tadahiro Kawasaki and Yoshizo Takai

Department of Material and Life Science, Graduate School of Engineering, Osaka University 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

*To whom correspondence should be addressed. E-mail: taya{at}atom.mls.eng.osaka-u.ac.jp

Using a three-dimensional image intensity distribution obtained by spherical aberration-corrected transmission electron microscopy, we studied a cross-sectional image (x-z image) of a gold crystal observed along the z-axis. In this x-z image, the bending of the interference fringes was observed in the edge region. We demonstrated that the bending is caused by a relative phase shift between the electron waves induced by dynamical electron scattering. By comparing with simulated images, the relative phase shift of about {pi}/4 was proved to correspond to a difference in thickness of ~0.9 nm.

Keywords     Cross-sectional image, transmission electron microscopy, three-dimensional image intensity distribution, three-dimensional Fourier filtering method, spherical aberration correction, dynamical electron scattering effect

Received     13 October 2005, accepted 9 March 2006


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