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Journal of Electron Microscopy Advance Access originally published online on July 11, 2006
Journal of Electron Microscopy 2006 55(3):137-142; doi:10.1093/jmicro/dfl021
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© The Author 2006. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please email: journals.permissions@oxfordjournals.org

High energy-resolution electron energy-loss spectroscopy study of the electric structure of double-walled carbon nanotubes

Yohei Sato1,*, Masami Terauchi1, Yahachi Saito2 and Riichiro Saito3

1 Institute of Multidisciplinary Research for Advanced Materials Tohoku University 2-1-1 Ktahira, Aoba-ku, Sendai 980-8577, Japan
2 School of Engineering, Nagoya University Furou-chou, Chikusa-ku, Nagoya 464-8603, Japan
3 Department of Physics, Tohoku University Aramaki, Aoba-ku, Sendai 980-8754, Japan

*To whom correspondence should be addressed. E-mail: y-sato{at}mail.tagen.tohoku.ac.jp

Electron energy-loss spectra were obtained from two double-walled carbon nanotubes (DWCNTs) with an energy resolution of 85 meV. The spectra showed multiple peak structures between 2 and 3 eV. However, peak positions are different for these two DWCNTs. The chiral indices of CNT layers of the two DWCNTs were determined to be (29,4)in (17,8)out and (46,6)out (26,21)in, respectively, by comparing experimental electron diffraction patterns with simulated ones. The spectra were also compared with simulated joint density of states, which were derived from the determined chiral indices. It was confirmed that the peak structures in the spectra are due to interband transitions intrinsic for tubular structures of graphitic sheets.

Keywords     carbon nanotube, chiral index, EELS, electron diffraction

Received     21 February 2006, accepted 8 June 2006


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Y. Sato, M. Terauchi, Y. Saito, K. Sato, and R. Saito
Relation between peak structures of loss functions of single double-walled carbon nanotubes and interband transition energies
J. Electron Microsc. (Tokyo), August 1, 2008; 57(4): 129 - 132.
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