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Journal of Electron Microscopy Advance Access originally published online on December 5, 2006
Journal of Electron Microscopy 2006 55(4):215-223; doi:10.1093/jmicro/dfl028
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© The Author 2006. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please email: journals.permissions@oxfordjournals.org

Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: I. Principle and test examples

Shunsuke Muto1,*, Richard C. Puetter2,3 and Kazuyoshi Tatsumi1

1 Department of Materials, Physics and Energy Engineering, Graduate School of Engineering, Nagoya University Chikusa-ku, Nagoya 464-8603, Japan
2 PixonImaging LLC 4930 Longford Street, San Diego, CA 92117, USA
3 Center for Astrophysics and Space Sciences, University of California San Diego, La Jolla, CA 92093, USA

*To whom correspondence should be addressed. E-mail: s-mutoh{at}nucl.nagoya-u.ac.jp

We explore the use of the Pixon method, one of the highest performance image reconstruction methods available today, for the analysis of electron energy loss spectra (EELS). The method takes particular advantage of two-dimensional (2-D) CCD data, in which the data are blurred by a PRF (point-response-function as measured by the low-loss spectrum) both in the direction of energy dispersion and in the cross-dispersion direction. The Pixon method is used to simultaneously (i) deconvolve the PRF, increasing the spectral resolution, and (ii) fit the data in the cross-dispersion direction which efficiently combines the signal into a single parent spectrum. Relative to 1-D methods, we demonstrate that our 2-D treatment (i) more effectively detects weak features and (ii) allows EELS methods to be applied to much lower signal-to-noise ratio data. Both of these advantages are critical to the future development of EELS analysis.

Keywords     electron energy loss spectroscopy, digital image processing, pixon method

Received      9 June 2006, accepted 19 September 2006


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Y. Sasano and S. Muto
Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals
J. Electron Microsc. (Tokyo), October 1, 2008; 57(5): 149 - 158.
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