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Journal of Electron Microscopy Advance Access originally published online on December 20, 2006
Journal of Electron Microscopy 2006 55(4):225-230; doi:10.1093/jmicro/dfl029
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© The Author 2006. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please email: journals.permissions@oxfordjournals.org

Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: II. Application to practical ELNES analysis of low SNR

Shunsuke Muto1,*, Kazuyoshi Tatsumi1, Richard C. Puetter2,3, Tomoko Yoshida1, Yu Yamamoto1 and Yusuke Sasano1

1 Department of Materials, Physics and Energy Engineering, Graduate School of Engineering, Nagoya University Chikusa-ku, Nagoya 464-8603, Japan
2 PixonImaging LLC, 4930 Longford Street San Diego, CA 92117, USA
3 Center for Astrophysics and Space Sciences, University of California San Diego, La Jolla, CA 92093, USA

*To whom correspondence should be addressed. E-mail: s-mutoh{at}nucl.nagoya-u.ac.jp

We applied Pixon deconvolution as introduced in Part I to several practical, examples of low signal-to-noise ratio (SNR), electron energy-loss spectra with a goal toward restoring their fine spectral features and/or improving the energy resolution. We demonstrate that by directly fitting the two-dimensional spectral data recorded on the CCD; the method enables us to reveal fine spectral structures. Consequently, Pixon reconstruction extends the ability to probe electronic states in very spatially localized areas, a capability currently unique to our method.

Keywords     Pixon method, electron energy-loss spectroscopy, ELNES, low SNR

Received      9 June 2006, accepted 19 September 2006


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Y. Sasano and S. Muto
Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals
J. Electron Microsc. (Tokyo), October 1, 2008; 57(5): 149 - 158.
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