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Journal of Electron Microscopy Advance Access originally published online on March 3, 2008
Journal of Electron Microscopy 2008 57(3):91-94; doi:10.1093/jmicro/dfn004
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© The Author 2008. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

Preparation of TEM samples of ferritic alloys

Z. Yao1,*, S. Xu1, M. L. Jenkins1 and M. A. Kirk2

1 Department of Materials, University of Oxford, Parks Rd., Oxford OX1 3PH, UK
2 Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA

* To whom correspondence should be addressed. E-mail: zhongwen.yao{at}materials.ox.ac.uk

We describe techniques for electropolishing irradiated ferritic specimens for examination under the TEM in situations where the foil quality is of utmost importance. First, we describe some modifications to the standard technique for making plan-view specimens aimed at optimizing the foil quality. Second, we describe a technique for making plan-view specimens from a region of buried damage in a specimen irradiated with 2 MeV Fe+ ions.

Keywords     TEM sample preparation, electropolishing, Fe, Fe–Cr alloys, ferritic–martensitic steels

Received     20 November 2007, accepted 7 February 2008


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