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Journal of Electron Microscopy Advance Access originally published online on June 2, 2008
Journal of Electron Microscopy 2008 57(4):119-122; doi:10.1093/jmicro/dfn009
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© The Author 2008. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

A simple technique for the estimation of the voltage of a transmission electron microscope

Duggi V. Sridhara Rao

Electron Microscopy Group, Defence Metallurgical Research Laboratory, Kanchanbagh Post, Hyderabad-500 058, India

To whom correspondence should be addressed. E-mail: vsrd2{at}cam.ac.uk

A convergent beam electron diffraction (CBED) technique has been described for the determination of the voltage of a transmission electron microscope (TEM). It involves observing the intersections of HOLZ lines (Formula ), (Formula ), (Formula ) and (Formula ), in the transmitted disc of the CBED pattern obtained along the [37 37 4] zone axis of silicon. It is suitable for the TEMs with operational voltage in the range of 200 kV, and is also free from the tilt limitations.

Keywords     TEM, CBED, voltage, silicon

Received     28 January 2008, accepted 16 May 2008

Present address: Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, United Kingdom.


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