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Journal of Electron Microscopy Advance Access originally published online on November 25, 2008
Journal of Electron Microscopy 2009 58(3):131-136; doi:10.1093/jmicro/dfn023
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© The Author 2008. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

This article appears in the following Journal of Electron Microscopy issue: Special number: Advanced electron microscopy in materials physics [View the issue table of contents]

Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy

Mitsuhiro Saito1, Koji Kimoto1,*, Takuro Nagai1, Shun Fukushima2, Daisuke Akahoshi2, Hideki Kuwahara2, Yoshio Matsui1 and Kazuo Ishizuka1,3

1 Advanced Nano Characterization Center, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044
2 Department of Physics, Sophia University, Chiyoda-ku, Tokyo 102-8554
3 HREM Research, Inc., Higashimatsuyama, Saitama, 355-0055, Japan

* To whom correspondence should be addressed. E-mail: kimoto.koji{at}nims.go.jp

We demonstrate local crystal structure analysis based on annular dark-field (ADF) imaging in scanning transmission electron microscopy (STEM). Using a stabilized STEM instrument and customized software, we first realize high accuracy of elemental discrimination and atom-position determination with a 10-pm-order accuracy, which can reveal major cation displacements associated with a variety of material properties, e.g. ferroelectricity and colossal magnetoresistivity. A-site ordered/disordered perovskite manganites Tb0.5Ba0.5MnO3 are analysed; A-site ordering and a Mn-site displacement of 12 pm are detected in each specific atomic column. This method can be applied to practical and advanced materials, e.g. strongly correlated electron materials.

Keywords     scanning transmission electron microscopy, annular dark-field imaging, perovskite oxide, crystal structure analysis, software, channelling

Received     26 July 2008, accepted 23 October 2008


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