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Journal of Electron Microscopy Advance Access originally published online on December 4, 2008
Journal of Electron Microscopy 2009 58(3):193-198; doi:10.1093/jmicro/dfn025
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© The Author 2008. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

This article appears in the following Journal of Electron Microscopy issue: Special number: Advanced electron microscopy in materials physics [View the issue table of contents]

Aberration-corrected STEM investigation of the M2 phase of MoVNbTeO selective oxidation catalyst

Douglas A. Blom1,*, William D. Pyrz2, Tom Vogt3 and Douglas J. Buttrey2

1 Electron Microscopy Center, University of South Carolina, Columbia, SC 29208
2 Department of Chemical Engineering, Center for Catalytic Science and Technology, University of Delaware, Newark, DE 19716 and
3 NanoCenter and Department of Chemistry and Biochemistry, University of South Carolina, Columbia, SC 29208, USA

* To whom correspondence should be addressed. E-mail: doug.blom{at}sc.edu.

The ‘M2’ phase of the oxidation catalyst MoVNbTeO was studied with an aberration-corrected STEM using HAADF imaging, and three 60° twin orientations were identified. Comparisons between the experimental HAADF images and image simulations suggest that the there are two different Te sites, as has been previously reported; however, there are differences between the structure proposed in DeSanto et al. (2004) Z. Kristogr. 219: 152 and the experimental HAADF images.

Keywords     aberration-corrected STEM, M2, MoVTeNbO, propane (amm)oxidiation

Received     29 August 2008, accepted 3 November 2008


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