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Journal of Electron Microscopy Advance Access originally published online on January 13, 2009
Journal of Electron Microscopy 2009 58(3):213-221; doi:10.1093/jmicro/dfn027
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© The Author 2009. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

This article appears in the following Journal of Electron Microscopy issue: Special number: Advanced electron microscopy in materials physics [View the issue table of contents]

Electron beam coherence measurements using diffracted beam interferometry/holography

Rodney A. Herring

Center for Advanced Materials and Related Technology, Department of Mechanical Engineering, University of Victoria, Victoria, British Columbia, V8N 4T6, Canada

To whom correspondence should be addressed. E-mail: rherring{at}uvic.ca

The intensity and coherence of elastically and inelastically scattered electrons have been studied by the interference of electron-diffracted beams using a method of diffracted beam interferometry/holography (DBI/H). In the interferograms produced, fringes were found to exist from low to high scattering angles. The intensity and coherence of the fringes are useful for understanding the contrast mismatch between experimental and simulated images found in atomic resolution images of crystals produced by transmission electron microscopy (TEM) and annular dark-field (ADF) scanning transmission electron microscopy (STEM). The fringes disappear when the interfering beams are separated from an exact overlay position, which produces a measurement of the beam's lateral coherence and holds promise for measuring the coherence of the respective quasi-particles associated with the energy loss electrons.

Keywords     holography, coherence, Stobbs factor, phonons, plasmons, magnons

Received      5 August 2008, accepted 1 December 2008


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