Skip Navigation



Journal of Electron Microscopy Advance Access published online on April 8, 2009
Journal of Electron Microscopy, doi:10.1093/jmicro/dfp018
This Article
Right arrow Full Text
Right arrow Full Text (PDF)
Right arrow All Versions of this Article:
58/4/245    most recent
dfp018v1
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Email this article to a friend
Right arrow Similar articles in this journal
Right arrow Similar articles in PubMed
Right arrow Alert me to new issues of the journal
Right arrow Add to My Personal Archive
Right arrow Download to citation manager
Right arrowRequest Permissions
Google Scholar
Right arrow Articles by Shindo, D.
Right arrow Articles by Kondo, Y.
Right arrow Search for Related Content
PubMed
Right arrow PubMed Citation
Right arrow Articles by Shindo, D.
Right arrow Articles by Kondo, Y.
Social Bookmarking
Add to CiteULike   Add to Connotea   Add to Del.icio.us  
What's this?

© The Author 2009. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

Development of a multifunctional TEM specimen holder equipped with a piezodriving probe and a laser irradiation port

Daisuke Shindo1,*, Kodai Takahashi1, Yasukazu Murakami1, Kazuya Yamazaki2, Syunji Deguchi2, Hiroaki Suga2 and Yukihito Kondo2

1 Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577
2 JEOL Co., Ltd, Akishima 196-8558, Japan

* To whom correspondence should be addressed. E-mail: shindo{at}tagen.tohoku.ac.jp

The double-probe piezodriving specimen holder that was recently developed by some of the present authors is modified to introduce a laser irradiation port in one of its two arms. As a result, the new specimen holder consists of a piezodriving probe and a laser irradiation port, both of which can be three-dimensionally controlled by using piezoelectric elements and micrometers. While the piezodriving probe interacts with the specimen set in the holder in several ways, the laser beam causes photo-induced phenomena to occur. By performing electron holography using the new specimen holder, we demonstrate that it is possible to evaluate the change in the electric field resulting from the discharging effect of laser irradiation on organic photoconductors.

Keywords     electron holography, electric field, electric potential, photoconductor, photo-induced phenomenon, charging

Received     22 December 2008, accepted 19 March 2009


Add to CiteULike CiteULike   Add to Connotea Connotea   Add to Del.icio.us Del.icio.us    What's this?




Disclaimer: Please note that abstracts for content published before 1996 were created through digital scanning and may therefore not exactly replicate the text of the original print issues. All efforts have been made to ensure accuracy, but the Publisher will not be held responsible for any remaining inaccuracies. If you require any further clarification, please contact our Customer Services Department.