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Journal of Electron Microscopy Advance Access published online on June 11, 2009
Journal of Electron Microscopy, doi:10.1093/jmicro/dfp028
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© The Author 2009. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

Development of an analytical environmental TEM system and its application

Keisuke Kishita1,2*, Hisashi Sakai1, Hiromochi Tanaka1, Hiroyasu Saka2, Kotaro Kuroda2, Masayuki Sakamoto3, Akira Watabe4 and Takeo Kamino4

1 Material Analysis Department, Toyota Motor Corporation, 1, Toyota-cho, Toyota, Aichi 471-8572
2 Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603
3 Hitachi High-Technology Trading Corporation, 832–2, Horiguchi, Hitachinaka, Ibaraki 312-0034 and
4 Hitachi High-Technologies Corporation, 882, Ichige, Hitachinaka, Ibaraki 312-8504, Japan

* To whom correspondence should be addressed. E-mail: kishita{at}keisuke.tec.toyota.co.jp

Many automotive materials, such as catalysts and fuel cell materials, undergo significant changes in structure or properties when subjected to temperature change or the addition of a gas. For this reason, in the development of these materials, it is important to study the behavior of the material under controlled temperatures and gaseous atmospheres. Recently, a new environmental transmission electron microscope (TEM) has been developed for observation with a high resolution at high temperatures and under gaseous atmospheres, thus making it possible to analyze reaction processes in details. Also, the new TEM provides a high degree of reproducibility of observation conditions, thus making it possible to compare and validate observation of various specimens under a given set of conditions. Furthermore, easiness of gas condition and temperature control can provide a powerful tool for the studying of the mechanism of material change, such as oxidation and reduction reactions.

Keywords     environmental TEM, gas reaction, high temperature, high resolution, oxidation, reduction

Received     16 October 2008, accepted 8 May 2009


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