Skip Navigation


Journal of Electron Microscopy Advance Access originally published online on July 8, 2009
Journal of Electron Microscopy 2009 58(6):341-347; doi:10.1093/jmicro/dfp033
This Article
Right arrow Full Text
Right arrow Full Text (PDF)
Right arrow All Versions of this Article:
58/6/341    most recent
dfp033v1
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Email this article to a friend
Right arrow Similar articles in this journal
Right arrow Similar articles in PubMed
Right arrow Alert me to new issues of the journal
Right arrow Add to My Personal Archive
Right arrow Download to citation manager
Right arrowRequest Permissions
Google Scholar
Right arrow Articles by Sawada, H.
Right arrow Articles by Suenaga, K.
PubMed
Right arrow PubMed Citation
Right arrow Articles by Sawada, H.
Right arrow Articles by Suenaga, K.
Social Bookmarking
 Add to CiteULike   Add to Connotea   Add to Del.icio.us  
What's this?

© The Author 2009. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

Correction of higher order geometrical aberration by triple 3-fold astigmatism field

Hidetaka Sawada1,2*, Takeo Sasaki1,2, Fumio Hosokawa2, Shuuichi Yuasa2, Mitsuhisa Terao2, Muneyuki Kawazoe2, Tomohiro Nakamichi2, Toshikatsu Kaneyama1,2, Yukihito Kondo2, Koji Kimoto1,3 and Kazutomo Suenaga1,4

1 Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo, 102-0075
2 JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo 196-8558
3 National Institute for Materials Science, 1-1 Namiki, Tsukukba, Ibaraki 305-0044
4 Research Center for Advanced Carbon Materials, National Institute of Advanced Industrial Science and Technology (AIST), Central 5, Tsukuba 305-8565, Japan

* To whom correspondence should be addressed. E-mail: hsawada{at}jeol.co.jp

A new concept of a spherical aberration correction system using three dodecapoles is proposed. The system compensates for higher order aberration of 6-fold astigmatism, which generally limits a uniform phase area for image forming and probe forming in an electron microscope with a conventional two-hexapole corrector. Triple 3-fold astigmatism field is used to correct the spherical aberration of the objective lens, and the total 3-fold astigmatism is eliminated by their combination. The optimum azimuth relationship among three dodecapoles is calculated to eliminate the 6-fold astigmatism. The principle of the method was verified using a mathematically complex representation. This new concept was experimentally tested with a scanning transmission electron microscope at 60 kV acceleration. The 6-fold astigmatism was certainly compensated and the coherent convergent angle became almost twice compared to a conventional double hexapole system.

Keywords     six-fold astigmatism, aberration correction, Ronchigram, trajectory, delta

Received      6 April 2009, accepted 1 June 2009


Add to CiteULike CiteULike   Add to Connotea Connotea   Add to Del.icio.us Del.icio.us    What's this?




Disclaimer: Please note that abstracts for content published before 1996 were created through digital scanning and may therefore not exactly replicate the text of the original print issues. All efforts have been made to ensure accuracy, but the Publisher will not be held responsible for any remaining inaccuracies. If you require any further clarification, please contact our Customer Services Department.