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Journal of Electron Microscopy Advance Access published online on August 18, 2009
Journal of Electron Microscopy, doi:10.1093/jmicro/dfp042
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© The Author 2009. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

Atomic force microscopy observation of the enamel roughness and depth profile after phosphoric acid etching

Juan Pablo Loyola-Rodriguez1,*, Veronica Zavala-Alonso1, Enrique Reyes-Vela1, Nuria Patiño-Marin1, Facundo Ruiz2 and Kenneth J. Anusavice3

1 The Master Degree in Dental Science with Specialization in Advanced General Dentistry Program
2 Faculty of Sciences, San Luis Potosi University, Av. Dr. Manuel Nava S/N, Zona Universitaria, CP 78290, San Luis Potosi, México
3 Department of Dental Biomaterials, College of Dentistry, University of Florida, PO Box 100446, Gainsville, FL 32610-0446, USA

* To whom correspondence should be addressed. E-mail: jloyola{at}uaslp.mx

The aim was to compare the enamel surface roughness (ESR) and absolute depth profile (ADP) (mean peak-to-valley height) by atomic force microscopy (AFM) before and after using four different phosphoric acids. A total of 160 enamel samples from 40 upper premolars were prepared. The inclusion criterion was that the teeth have healthy enamel. Exclusion criteria included any of the following conditions: facial restorations, caries lesions, enamel hypoplasia and dental fluorosis. Evaluations of the ESR and ADP were carried out by AFM. The Mann–Whitney U-test was used to compare continuous variables and the Wilcoxon test was used to analyze the differences between before and after etching. There were statistically significant differences (P ≤ 0.05) among mean surface roughness and absolute depth before and after using four different phosphoric acids in healthy enamel; Etch-37 and Scotchbond Etching Gel showed higher profiles after etching (P ≤ 0.05). There were statistically significant differences (P ≤ 0.05) among roughness and ADP before and after using four different phosphoric acids in healthy enamel. However, consistently Etch-37 and Scotchbond Etching Gel showed the highest increase regarding the ESR and ADP after etching healthy enamel. AFM was a useful tool to study site-specific structural topography changes in enamel after phosphoric acid etching.

Keywords     enamel, phosphoric acid, AFM, roughness, depth profile

Received     14 May 2009, accepted 27 July 2009


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