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Journal of Electron Microscopy Advance Access published online on November 14, 2009
Journal of Electron Microscopy, doi:10.1093/jmicro/dfp052
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© The Author 2009. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

High-resolution low-dose scanning transmission electron microscopy

James P. Buban1,*, Quentin Ramasse2, Bryant Gipson1,5, Nigel D. Browning3,4 and Henning Stahlberg1,5

1 Department of Molecular and Cellular Biology, College of Biological Sciences, University of California at Davis, 1 Shields Ave, Davis
2 Lawrence Berkeley National Laboratory, Berkeley
3 Department of Chemical and Materials Science, University of California at Davis, 1 Shields Ave, Davis
4 Materials Science and Technology Division, Chemistry, Materials, Earth and Life Sciences Directorate, Lawrence Livermore National Laboratory, P.O. Box 808; L-356 Livermore, CA 94550, USA
5 Present address: C-CINA, Biozentrum, University Basel, 4058 Basel, Switzerland

* To whom correspondence should be addressed. E-mail: james.buban{at}gmail.com

During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording with a conventional field-emission gun STEM, while maintaining the high-resolution capability of the instrument. Our findings show that a combination of reduced pixel dwell time and reduced gun current can achieve radiation doses comparable to low-dose TEM.

Keywords     STEM, low-dose, aberration correction

Received     11 February 2009, accepted 24 September 2009


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