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Journal of Electron Microscopy Advance Access originally published online on August 25, 2005
Journal of Electron Microscopy 2005 54(3):209-214; doi:10.1093/jmicro/dfi029
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© The Author 2005. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please email: journals.permissions@oxfordjournals.org

A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM

Jun Yamasaki, Tomoyuki Kawai and Nobuo Tanaka*

EcoTopia Science Institute and Department of Crystalline Materials Science, Nagoya University, Chikusa-ku, Nagoya, 464-8603, Japan

* To whom correspondence should be addressed. E-mail: a41263a{at}nucc.cc.nagoya-u.ac.jp

A simple and practical method for minimizing non-linear image contrast in spherical aberration-corrected (Cs-corrected) high-resolution transmission electron microscopy is presented. The effectiveness of the method is considered from the viewpoints of theoretical formulations and image simulations including second-order imaging effects. The method is one of the advantages of Cs-correction and applied to high-resolution images down to 0.1 nm. The dynamical diffraction effect is carefully evaluated, which shows that the phase deviation of diffracted waves from {pi}/2 violates the present method in thicker crystals over ~10 nm.

Keywords     CS-corrected HRTEM, non-linear image contrast, linear contrast terms, lattice images, subtraction method, dynamical diffraction effect, phase deviation

Received     13 January 2005, accepted 22 March 2005


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