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Journal of Electron Microscopy Advance Access originally published online on July 7, 2005
Journal of Electron Microscopy 2005 54(5):445-453; doi:10.1093/jmicro/dfh107
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© The Author 2005. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please email: journals.permissions@oxfordjournals.org

Restoring atomic configuration at interfaces by image deconvolution

Chun-yan Tang and Fang-hua Li*

Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, China

* To whom correspondence should be addressed. E-mail: lifh{at}aphy.iphy.ac.cn

The image deconvolution technique in combination with dynamical scattering effect correction developed previously for crystal defect investigation has been modified to meet the needs of interface studies and applied to a {111} twin model of Si. Elliptical windows are utilized as a new means for Fourier filtering and correcting the amplitudes of reflections. Images were simulated with a 200 kV field-emission high-resolution electron microscope. After image restoration, four images simulated with different defocus values were transformed into structure images with atomic columns revealed individually at correct positions. The effectiveness of the technique is discussed.

Keywords     high-resolution transmission electron microscopy, interfaces, image deconvolution, dynamical scattering effect, elliptical windows

Received     26 May 2004, accepted 1 December 2004


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