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Journal of Electron Microscopy Advance Access published online on July 7, 2005
Journal of Electron Microscopy, doi:10.1093/jmicro/dfh107
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© The Author 2005. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For Permissions, please email: journals.permissions@oupjournals.org
Received May 26, 2004
Accepted December 1, 2004

Full-length paper

Restoring atomic configuration at interfaces by image deconvolution

Chun-yan Tang 1 and Fang-hua Li 1*

1 Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, China

* To whom correspondence should be addressed.
Fang-hua Li, E-mail: lifh{at}aphy.iphy.ac.cn


  Abstract

The image deconvolution technique in combination with dynamical scattering effect correction developed previously for crystal defect investigation has been modified to meet the needs of interface studies and applied to a [111] twin model of Si. Elliptical windows are utilized as a new means for Fourier filtering and correcting the amplitudes of reflections. Images were simulated with a 200 kV field-emission highresolution electron microscope. After image restoration, four images simulated with different defocus values were transformed into structure images with atomic columns revealed individually at correct positions. The effectiveness of the technique is discussed.

Keywords: high-resolution transmission electron microscopy; interfaces; image deconvolution; dynamical scattering effect; elliptical windows.
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