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Journal of Electron Microscopy Advance Access published online on August 25, 2005
Journal of Electron Microscopy, doi:10.1093/jmicro/dfi029
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© Japanese Society of Microscopy
Received January 13, 2005
Accepted March 22, 2005

Full-length paper

A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM

Jun Yamasaki 1, Tomoyuki Kawai 1, and Nobuo Tanaka 1*

1 EcoTopia Science Institute and Department of Crystalline Materials Science, Nagoya University, Chikusa-ku, Nagoya, 464-8603, Japan

* To whom correspondence should be addressed.
Nobuo Tanaka, E-mail: a41263a{at}nucc.cc.nagoya-u.ac.jp


  Abstract

A simple and practical method for minimizing non-linear image contrast in spherical aberration-corrected (Cs-corrected) high-resolution transmission electron microscopy is presented. The effectiveness of the method is considered from the viewpoints of theoretical formulations and image simulations including second-order imaging effects. The method is one of the advantages of Cs-correction and applied to high-resolution images down to 0.1 nm. The dynamical diffraction effect is carefully evaluated, which shows that the phase deviation of diffracted waves from {pi}/2 violates the present method in thicker crystals over ~10 nm.

Keywords: Cs-corrected HRTEM; non-linear image contrast; linear contrast terms; lattice images; subtraction method; dynamical diffraction effect; phase deviation.
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