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Journal of Electron Microscopy Advance Access published online on August 25, 2005
Journal of Electron Microscopy, doi:10.1093/jmicro/dfi034
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© Japanese Society of Microscopy
Received December 23, 2004
Accepted March 13, 2005

Article

Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems

Jingyue Liu 1*

1 Monsanto Company, U1E, 800 North Lindbergh Boulevard, St Louis, MO 63167, USA

* To whom correspondence should be addressed.
Jingyue Liu, E-mail: jingyue.liu{at}monsanto.com


  Abstract

Scanning transmission electron microscopy (STEM) techniques can provide imaging, diffraction and spectroscopic information, either simultaneously or in a serial manner, of the specimen with an atomic or a sub-nanometer spatial resolution. High-resolution STEM imaging, when combined with nanodiffraction, atomic resolution electron energy-loss spectroscopy and nanometer resolution X-ray energy dispersive spectroscopy techniques, is critical to the fundamental studies of importance to nanoscience and nanotechnology. The availability of sub-nanometer or sub-angstrom electron probes in a STEM instrument, due to the use of a field emission gun and aberration correctors, ensures the greatest capabilities for studies of sizes, shapes, defects, crystal and surface structures, and compositions and electronic states of nanometer-size regions of thin films, nanoparticles and nanoparticle systems. The various imaging, diffraction and spectroscopy modes available in a dedicated STEM or a field emission TEM/STEM instrument are reviewed and the application of these techniques to the study of nanoparticles and nanostructured catalysts is used as an example to illustrate the critical role of the various STEM techniques in nanotechnology and nanoscience research.

Keywords: electron microscopy; STEM; Z-contrast microscopy; nanodiffraction; SEM; EELS; EDS; Auger; nanoparticle; supported catalyst; surface.
Dedicated to the memory of the late Professor John M. Cowley.
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