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Journal of Electron Microscopy Advance Access published online on August 25, 2005
Journal of Electron Microscopy, doi:10.1093/jmicro/dfi042
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© The Author 2005. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For Permissions, please email: journals.permissions@oupjournals.org
Received December 28, 2004
Accepted March 16, 2005

Article

Calibration of projector lens distortions

F. Hüe 1, C. L. Johnson 2, S. Lartigue-Korinek 1, G. Wang 1, P. R. Buseck 3, and M. J. Hÿtch 4*

1 CECM-CNRS, 15 rue Georges Urbain, 94407 Vitry-sur-Seine, France
2 Department of Chemistry and Biochemistry, Arizona State University, Tempe, AZ 85287-1604, USA; Present address: Center for Functional Nanomaterials, Brookhaven National Laboratory, Mail Stop 480, Upton, NY 11973, USA
3 Department of Chemistry and Biochemistry, Arizona State University, Tempe, AZ 85287-1604, USA; Department of Geological Sciences, Arizona State University, Tempe, AZ 85287-1404, USA
4 CECM-CNRS, 15 rue Georges Urbain, 94407 Vitry-sur-Seine, France; Present address: CEMES-CNRS, 29 rue Jeanne Marvig, 31055 Toulouse, France

* To whom correspondence should be addressed.
M. J. Hÿtch, E-mail: hytch{at}cemes.fr


  Abstract

The distortions introduced into high-resolution transmission electron microscope (HRTEM) images by the projector lens system are an important source of systematic error for quantitative displacement and strain determination. Using geometric phase analysis of images of perfect crystals, we measured these errors for two different transmission electron microscopes. Local magnification varies by as much as 5%, and rotation can reach 2° across a typical image. Our experimental results are compared with theory, and optical pincushion and spiral distortion coefficients are determined. A method for calibrating and removing these distortions is presented that enables quantification to 0.1% strain and 0.1° rotation across the whole field of view. This calibration is also critical for the accurate measurement of local lattice parameters from HRTEM images.

Keywords: HRTEM; projector lens; optical distortions; lattice parameter determination; strain; geometric phase.
Dedicated to the memory of our long-time and inspiring colleague, John M. Cowley, and for those of us at ASU, a valued friend.
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