Journal of Electron Microscopy Advance Access published online on August 2, 2005
Journal of Electron Microscopy, doi:10.1093/jmicro/dfi047
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1 Meiji University, Department of Physics, 1-1-1 Higashimita, Tama-ku, Kawasaki 214-8571, Japan
* To whom correspondence should be addressed. The projection X-ray microscope utilises a very small X-ray source emitted from a thin (0.1-3 µm) target metal film excited by the focused electron beam of a scanning electron microscope. When an object is placed just below the target metal film, the diverging X-rays enlarge the shadow of the object. Because no X-ray optics such as a zone-plate is used, the focal depth is, in principle, infinitely large. We exploited this to apply projection X-ray microscopy to three-dimensional (3-D) structure analysis by means of cone-beam computed tomography. The projection images of a small arthropod (Pseudocneorhinus bifasciatus, 5 mm in length), was recorded at 3° increments over the whole range (360°) of a stepping-motor-controlled sample rotator. A 3-D image was reconstructed from corn-beam projections using a filtered back-projection algorithm. The reconstructed 3-D image showed in detail the internal structure of an opaque object.
Received April 14, 2005
Accepted May 13, 2005
Full-length paper
Micro-CT of Pseudocneorhinus bifasciatus by projection X-ray microscopy
2 Tokyo Institute of Technology, Inter Disciplinary Graduate School of Science and Engineering, Department of Information Processing, 4259 Nagatsuda, Midori-ku, Yokohama 226-8503, Japan
Hideyuki Yoshimura, E-mail: hyoshi{at}isc.meiji.ac.jp
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