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Journal of Electron Microscopy Advance Access published online on April 5, 2006
Journal of Electron Microscopy, doi:10.1093/jmicro/dfl006
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© The Author 2006. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For Permissions, please email: journals.permissions@oxfordjournals.org
Received October 13, 2005
Accepted March 9, 2006

Full-length: Physical

Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy

Masaki Taya 1 *, Tadahiro Kawasaki 1, and Yoshizo Takai 1

1 Department of Material and Life Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

* To whom correspondence should be addressed.
Masaki Taya, E-mail: taya{at}atom.mls.eng.osaka-u.ac.jp


  Abstract

Using a three-dimensional image intensity distribution obtained by spherical aberration-corrected transmission electron microscopy, we studied a cross-sectional image (x-z image) of a gold crystal observed along the z-axis. In this x-z image, the bending of the interference fringes was observed in the edge region. We demonstrated that the bending is caused by a relative phase shift between the electron waves induced by dynamical electron scattering. By comparing with simulated images, the relative phase shift of about {pi}/4 was proved to correspond to a difference in thickness of ~0.9 nm.

Keywords: Cross-sectional image; transmission electron microscopy; three-dimensional image intensity distribution; three-dimensional Fourier filtering method; spherical aberration correction; dynamical electron scattering effect.
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