Journal of Electron Microscopy Advance Access published online on June 28, 2006
Journal of Electron Microscopy, doi:10.1093/jmicro/dfl016
| ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
1 Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Mihoga-oka 7-1, Ibaraki, Osaka 567-0047, Japan
* To whom correspondence should be addressed. Low-energy, high-resolution scanning transmission electron microscopy (STEM) is introduced as a convenient method for observing unstained biological specimens. By reducing the electron energy, the cross section for light elements becomes comparable to that of conventional electron microscopy observations. The STEM mode exhibited the advantage that the induced energy loss and charge build-up in the sample affected the image to a lesser extent than in the TEM or SEM mode. Furthermore, the efficiency of an STEM detector is high, and the total radiation damage can be reduced if thermal damage due to localized heating at a slow scan operation can be overcome. We applied this method for observations of biological samples that were in the form of thin slices, fine fibers and small particles. When the supporting film for samples is absent, the resolution and the contrast of STEM images can be maintained similar to SEM and TEM images, respectively.
Received January 5, 2006
Accepted May 15, 2006
Full-length paper: Biological
Observations of unstained biological specimens using a low-energy, high-resolution STEM
Akio Takaoka 1 *
and
Toshiaki Hasegawa 1
Akio Takaoka, E-mail: takaoka{at}uhvem.osaka-u.ac.jp
![]()
Abstract ![]()
CiteULike
Connotea
Del.icio.us What's this?
This article has been cited by other articles:
![]() |
M. R. Lee, D. J. Brown, C. L. Smith, M. E. Hodson, M. MacKenzie, and R. Hellmann Characterization of mineral surfaces using FIB and TEM: A case study of naturally weathered alkali feldspars American Mineralogist, August 1, 2007; 92(8-9): 1383 - 1394. [Abstract] [Full Text] [PDF] |
||||
![]() |
M. R. Lee and C. L. Smith Scanning transmission electron microscopy using a SEM: Applications to mineralogy and petrology Mineralogical Magazine, October 1, 2006; 70(5): 579 - 590. [Abstract] [Full Text] [PDF] |
||||

