Skip Navigation



Journal of Electron Microscopy Advance Access published online on June 28, 2006

Journal of Electron Microscopy, doi:10.1093/jmicro/dfl016
This Article
Right arrow Full Text (PDF)
Right arrow All Versions of this Article:
55/3/157    most recent
dfl016v1
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Services
Right arrow Email this article to a friend
Right arrow Similar articles in this journal
Right arrow Similar articles in PubMed
Right arrow Alert me to new issues of the journal
Right arrow Add to My Personal Archive
Right arrow Download to citation manager
Right arrowRequest Permissions
Google Scholar
Right arrow Articles by Takaoka, A.
Right arrow Articles by Hasegawa, T.
Right arrow Search for Related Content
PubMed
Right arrow PubMed Citation
Right arrow Articles by Takaoka, A.
Right arrow Articles by Hasegawa, T.
Social Bookmarking
 Add to CiteULike   Add to Connotea   Add to Del.icio.us  
What's this?

© The Author 2006. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For Permissions, please email: journals.permissions@oxfordjournals.org
Received January 5, 2006
Accepted May 15, 2006

Full-length paper: Biological

Observations of unstained biological specimens using a low-energy, high-resolution STEM

Akio Takaoka 1 * and Toshiaki Hasegawa 1

1 Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Mihoga-oka 7-1, Ibaraki, Osaka 567-0047, Japan

* To whom correspondence should be addressed.
Akio Takaoka, E-mail: takaoka{at}uhvem.osaka-u.ac.jp


   Abstract

Low-energy, high-resolution scanning transmission electron microscopy (STEM) is introduced as a convenient method for observing unstained biological specimens. By reducing the electron energy, the cross section for light elements becomes comparable to that of conventional electron microscopy observations. The STEM mode exhibited the advantage that the induced energy loss and charge build-up in the sample affected the image to a lesser extent than in the TEM or SEM mode. Furthermore, the efficiency of an STEM detector is high, and the total radiation damage can be reduced if thermal damage due to localized heating at a slow scan operation can be overcome. We applied this method for observations of biological samples that were in the form of thin slices, fine fibers and small particles. When the supporting film for samples is absent, the resolution and the contrast of STEM images can be maintained similar to SEM and TEM images, respectively.

Keywords: STEM; unstained specimen; low energy; cross section; chromatin fiber.
Add to CiteULike CiteULike   Add to Connotea Connotea   Add to Del.icio.us Del.icio.us    What's this?


This article has been cited by other articles:


Home page
American MineralogistHome page
M. R. Lee, D. J. Brown, C. L. Smith, M. E. Hodson, M. MacKenzie, and R. Hellmann
Characterization of mineral surfaces using FIB and TEM: A case study of naturally weathered alkali feldspars
American Mineralogist, August 1, 2007; 92(8-9): 1383 - 1394.
[Abstract] [Full Text] [PDF]


Home page
Mineral MagHome page
M. R. Lee and C. L. Smith
Scanning transmission electron microscopy using a SEM: Applications to mineralogy and petrology
Mineralogical Magazine, October 1, 2006; 70(5): 579 - 590.
[Abstract] [Full Text] [PDF]



Disclaimer: Please note that abstracts for content published before 1996 were created through digital scanning and may therefore not exactly replicate the text of the original print issues. All efforts have been made to ensure accuracy, but the Publisher will not be held responsible for any remaining inaccuracies. If you require any further clarification, please contact our Customer Services Department.