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Journal of Electron Microscopy Advance Access published online on July 11, 2006
Journal of Electron Microscopy, doi:10.1093/jmicro/dfl021
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© The Author 2006. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For Permissions, please email: journals.permissions@oxfordjournals.org
Received February 21, 2006
Accepted June 8, 2006

Full-length: Physical

High energy-resolution electron energy-loss spectroscopy study of the electric structure of double-walled carbon nanotubes

Yohei Sato 1 *, Masami Terauchi 1, Yahachi Saito 2, and Riichiro Saito 3

1 Institute of Multidisciplinary Research for Advanced Materials Tohoku University, 2-1-1 Ktahira, Aoba-ku, Sendai 980-8577, Japan
2 School of Engineering, Nagoya University, Furou-chou, Chikusa-ku, Nagoya 464-8603, Japan
3 Department of Physics, Tohoku University, Aramaki, Aoba-ku, Sendai 980-8754, Japan

* To whom correspondence should be addressed.
Yohei Sato, E-mail: y-sato{at}mail.tagen.tohoku.ac.jp


  Abstract

Electron energy-loss spectra were obtained from two double-walled carbon nanotubes (DWCNTs) with an energy resolution of 85 meV. The spectra showed multiple peak structures between 2 and 3 eV. However, peak positions are different for these two DWCNTs. The chiral indices of CNT layers of the two DWCNTs were determined to be (29,4)in (17,8)out and (46,6)out (26,21)in, respectively, by comparing experimental electron diffraction patterns with simulated ones. The spectra were also compared with simulated joint density of states, which were derived from the determined chiral indices. It was confirmed that the peak structures in the spectra are due to interband transitions intrinsic for tubular structures of graphitic sheets.

Keywords: carbon nanotube; chiral index; EELS; electron diffraction.
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Y. Sato, M. Terauchi, Y. Saito, K. Sato, and R. Saito
Relation between peak structures of loss functions of single double-walled carbon nanotubes and interband transition energies
J. Electron Microsc. (Tokyo), August 1, 2008; 57(4): 129 - 132.
[Abstract] [Full Text] [PDF]


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