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Journal of Electron Microscopy Advance Access published online on December 20, 2006
Journal of Electron Microscopy, doi:10.1093/jmicro/dfl029
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© The Author 2006. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For Permissions, please email: journals.permissions@oxfordjournals.org
Received June 9, 2006
Accepted September 19, 2006

Full-length: Physical

Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: II. Application to practical ELNES analysis of low SNR

Shunsuke Muto 1 *, Kazuyoshi Tatsumi 1, Richard C. Puetter 2, Tomoko Yoshida 1, Yu Yamamoto 1, and Yusuke Sasano 1

1 Department of Materials, Physics and Energy Engineering, Graduate School of Engineering, Nagoya University, Chikusa-ku, Nagoya 464-8603, Japan
2 PixonImaging LLC, 4930 Longford Street, San Diego, CA 92117, USA; Center for Astrophysics and Space Sciences, University of California, San Diego, La Jolla, CA 92093, USA

* To whom correspondence should be addressed.
Shunsuke Muto, E-mail: s-mutoh{at}nucl.nagoya-u.ac.jp


  Abstract

We applied Pixon deconvolution as introduced in Part I to several practical, examples of low signal-to-noise ratio (SNR), electron energy-loss spectra with a goal toward restoring their fine spectral features and/or improving the energy resolution. We demonstrate that by directly fitting the two-dimensional spectral data recorded on the CCD; the method enables us to reveal fine spectral structures. Consequently, Pixon reconstruction extends the ability to probe electronic states in very spatially localized areas, a capability currently unique to our method.

Keywords: Pixon method; electron energy-loss spectroscopy; ELNES, low SNR.
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Y. Sasano and S. Muto
Energy-drift correction of electron energy-loss spectra from prolonged data accumulation of low SNR signals
J. Electron Microsc. (Tokyo), October 1, 2008; 57(5): 149 - 158.
[Abstract] [Full Text] [PDF]


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