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Journal of Electron Microscopy Advance Access published online on November 6, 2008
Journal of Electron Microscopy, doi:10.1093/jmicro/dfn022
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© The Author 2008. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

Rapid autotuning for crystalline specimens from an inline hologram

Andrew R. Lupini* and Stephen J. Pennycook

Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA

* To whom correspondence should be addressed. E-mail: 9az{at}ornl.gov.

A method to measure the aberration function for a crystalline specimen from a single inline hologram or ‘Ronchigram’ by dividing it up into small patches is derived. Measurement of aberrations is demonstrated from both dynamical simulations and experimental Ronchigrams. This method should allow rapid fine-tuning on a variety of crystalline specimens and represents a key step toward active optics for scanning transmission electron microscopy.

Keywords     STEM, aberration correction, Ronchigram, aberration measurement, Cs

Received     24 May 2008, accepted 7 October 2008


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