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Journal of Electron Microscopy Advance Access published online on January 24, 2009
Journal of Electron Microscopy, doi:10.1093/jmicro/dfp002
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© The Author 2009. Published by Oxford University Press on behalf of Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oxfordjournals.org

Reduction of time-varying nanotesla magnetic fields from electric power lines by twisting

Auke J. Been, Gerrit A. Folkertsma, Hein H.J. Verputten, Thijs Bolhuis and Leon Abelmann*

MESA+ and Impact Research Institutes, University of Twente, PO Box 217, 7500 AE Enschede, The Netherlands

* To whom correspondence should be addressed: E-mail: l.abelmann{at}utwente.nl

Time-varying magnetic fields generated by electrical power lines in the laboratory can disturb electron microscope imaging. Modern microscopes require these fields to be below 10 nT [2]. We calculated and measured magnetic fields from straight and twisted current-carrying wires, and show that without twisting, this value cannot be reached.

Keywords     electron microscopy, instrumentation, magnetic fields, disturbance, electric circuitry, calculations

Received      4 December 2008, accepted 23 December 2008


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