Journal of Electron Microscopy

Letter:

Hidetaka Sawada, Takeshi Tomita, Mikio Naruse, Toshikazu Honda, Paul Hambridge, Peter Hartel, Maximilian Haider, Crispin Hetherington, Ron Doole, Angus Kirkland, John Hutchison, John Titchmarsh, and David Cockayne

Experimental evaluation of a spherical aberration-corrected TEM and STEM
J Electron Microsc (Tokyo) 2005 0: 11; doi:10.1093/jmicro/dfi001 [Abstract] [PDF]  

Jun Yamasaki, Hidetaka Sawada, and Nobuo Tanaka

First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM
J Electron Microsc (Tokyo) 2005 0: 281; doi:10.1093/jmicro/dfi028 [Abstract] [PDF]  

Kousuke Kimura, Satoshi Hata, Syo Matsumura, and Takao Horiuchi

Dark-field transmission electron microscopy for a tilt series of ordering alloys: toward electron tomography
J Electron Microsc (Tokyo) 2005 0: 601; doi:10.1093/jmicro/dfi060 [Abstract] [PDF]  

Note:

Kea Joo Lee, Chang-Hyun Park, and Im Joo Rhyu

Efficient three-dimensional reconstruction of synapse with high-voltage electron microscopy
J Electron Microsc (Tokyo) 2005 0: 21; doi:10.1093/jmicro/dfi002 [Abstract] [PDF] [Supplementary Data]  

Akira Sawaguchi, Soyuki Ide, and Tatsuo Suganuma

Application of 10-µm thin stainless foil to a new assembly of the specimen carrier in high-pressure freezing
J Electron Microsc (Tokyo) 2005 0: 231; doi:10.1093/jmicro/dfi023 [Abstract] [PDF]  

Chao Yang, Hai-Bo Zhang, Jing-Jing Li, and Akio Takaoka

The top-bottom effect of a tilted thick specimen and its influence on electron tomography
J Electron Microsc (Tokyo) 2005 0: 571; doi:10.1093/jmicro/dfi057 [Abstract] [PDF]  

Full-length paper:

Tohru Ishitani, Chisato Kamiya, and Mitsugu Sato

Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy
J Electron Microsc (Tokyo) 2005 0: 31; doi:10.1093/jmicro/dfi003 [Abstract] [PDF]  

Kazuo Ishizuka and Brendan Allman

Phase measurement of atomic resolution image using transport of intensity equation
J Electron Microsc (Tokyo) 2005 0: 241; doi:10.1093/jmicro/dfi024 [Abstract] [PDF]  

Takayoshi Tanji, Hiromochi Tanaka, and Takayuki Kojima

Development of a real-time stereo transmission electron microscope
J Electron Microsc (Tokyo) 2005 0: 251; doi:10.1093/jmicro/dfi025 [Abstract] [PDF]  

Jun Yamasaki, Tomoyuki Kawai, and Nobuo Tanaka

A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM
J Electron Microsc (Tokyo) 2005 0: 291; doi:10.1093/jmicro/dfi029 [Abstract] [PDF]  

Masao Komatsu and Hirotaro Mori

In situ HVEM study on copper oxidation using an improved environmental cell
J Electron Microsc (Tokyo) 2005 0: 321; doi:10.1093/jmicro/dfi032 [Abstract] [PDF]  

Jun-ichi Niitsuma, Hidetoshi Oikawa, Eiji Kimura, Tatsuo Ushiki, and Takashi Sekiguchi

Cathodoluminescence investigation of organic materials
J Electron Microsc (Tokyo) 2005 0: 431; doi:10.1093/jmicro/dfi043 [Abstract] [PDF]  

Akira Tanisako, Ayumi Hori, Aya Okumura, Chikara Miyata, Chiaki Kuzuryu, Takashi Obi, and Hideyuki Yoshimura

Micro-CT of Pseudocneorhinus bifasciatus by projection X-ray microscopy
J Electron Microsc (Tokyo) 2005 0: 471; doi:10.1093/jmicro/dfi047 [Abstract] [PDF]  

Jie Pan, Xin Pan, Na Wang, Mohammad Ghazizadeh, and Anjana Yeldandi

Characterization of the degradation of recombinant rat urate oxidase in tetracycline controlled gene expression cells
J Electron Microsc (Tokyo) 2005 0: 481; doi:10.1093/jmicro/dfi048 [Abstract] [PDF]  

Fumio Hosokawa, Radostin Danev, Yoshihiro Arai, and Kuniaki Nagayama

Transfer doublet and an elaborated phase plate holder for 120 kV electron-phase microscope
J Electron Microsc (Tokyo) 2005 0: 491; doi:10.1093/jmicro/dfi049 [Abstract] [PDF]  

Shigeo Okayama, Satoshi Haraichi, and Hirofumi Matsuhata

Reference sample for the evaluation of SEM image resolution at a high magnification--nanometer-scale Au particles on an HOPG substrate
J Electron Microsc (Tokyo) 2005 0: 531; doi:10.1093/jmicro/dfi053 [Abstract] [PDF]  

Bernd Zechmann, Maria Müller, and Günther Zellnig

Effects of different fixation and freeze substitution methods on the ultrastructural preservation of ZYMV-infected Cucurbita pepo (L.) leaves
J Electron Microsc (Tokyo) 2005 0: 541; doi:10.1093/jmicro/dfi054 [Abstract] [PDF]  

Andreas Lenk, Hannes Lichte, and Uwe Muehle

2D-mapping of dopant distribution in deep sub micron CMOS devices by electron holography using adapted FIB-preparation
J Electron Microsc (Tokyo) 2005 0: 551; doi:10.1093/jmicro/dfi055 [Abstract] [PDF]  

Fumio Watari

In situ quantitative analysis of etching process of human teeth by atomic force microscopy
J Electron Microsc (Tokyo) 2005 0: 561; doi:10.1093/jmicro/dfi056 [Abstract] [PDF]  

Ryushin Mizuta, Midori Mizuta, and Daisuke Kitamura

Guanine is indispensable for immunoglobulin switch region RNA-DNA hybrid formation
J Electron Microsc (Tokyo) 2005 0: 581; doi:10.1093/jmicro/dfi058 [Abstract] [PDF]  

Francisco Ceric, Doris Silva, and Pilar Vigil

Ultrastructure of the human periovulatory cervical mucus
J Electron Microsc (Tokyo) 2005 0: 1061; doi:10.1093/jmicro/dfh106 [Abstract] [PDF]  

Chun-yan Tang and Fang-hua Li

Restoring atomic configuration at interfaces by image deconvolution
J Electron Microsc (Tokyo) 2005 0: 1071; doi:10.1093/jmicro/dfh107 [Abstract] [PDF]  

Articles:

Kenji Matsuda, Susumu Ikeno, Ilona Müllerová, and Ludk Frank

The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites
J Electron Microsc (Tokyo) 2005 0: 301; doi:10.1093/jmicro/dfi030 [Abstract] [PDF]  

Agnieszka Wochna, Edyta Niemczyk, Chieko Kurono, Makoto Masaoka, Anna Majczak, Jakub Kdzior, Ewa Somiska, Marcin Lipiski, and Takashi Wakabayashi

Role of mitochondria in the switch mechanism of the cell death mode from apoptosis to necrosis--Studies on ⁰ cells
J Electron Microsc (Tokyo) 2005 0: 311; doi:10.1093/jmicro/dfi031 [Abstract] [PDF]  

Zuzanna Liliental-Weber, Dmitri N. Zakharov, Kin M. Yu, Joel W. Ager, III, Wladyslaw Walukiewicz, Eugene E. Haller, Hai Lu, and William J. Schaff

Compositional modulation in In_xGa_1-xN: TEM and X-ray studies
J Electron Microsc (Tokyo) 2005 0: 331; doi:10.1093/jmicro/dfi033 [Abstract] [PDF]  

Jingyue Liu

Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems
J Electron Microsc (Tokyo) 2005 0: 341; doi:10.1093/jmicro/dfi034 [Abstract] [PDF]  

Michael A. O'Keefe, Lawrence F. Allard, and Douglas A. Blom

HRTEM imaging of atoms at sub-Ångström resolution
J Electron Microsc (Tokyo) 2005 0: 361; doi:10.1093/jmicro/dfi036 [Abstract] [PDF]  

Renu Sharma, Peter Rez, Michael M. J. Treacy, and Steven J. Stuart

In situ observation of the growth mechanisms of carbon nanotubes under diverse reaction conditions
J Electron Microsc (Tokyo) 2005 0: 371; doi:10.1093/jmicro/dfi037 [Abstract] [PDF]  

J. A. Venables, G. G. Hembree, J. Drucker, P. A. Crozier, and M. R. Scheinfein

The MIDAS project at ASU: John Cowley's vision and practical results
J Electron Microsc (Tokyo) 2005 0: 381; doi:10.1093/jmicro/dfi038 [Abstract] [PDF]  

Yong Ding and Zhong Lin Wang

Electron energy-loss spectroscopy study of ZnO nanobelts
J Electron Microsc (Tokyo) 2005 0: 391; doi:10.1093/jmicro/dfi039 [Abstract] [PDF]  

Nan Yao, Kirk Hou, Christopher D. Haines, Nathan Etessami, Varadh Ranganathan, Susan B. Halpern, Bernard H. Kear, Lisa C. Klein, and George H. Sigel, Jr

Nanostructure of Er³⁺ doped silicates
J Electron Microsc (Tokyo) 2005 0: 401; doi:10.1093/jmicro/dfi040 [Abstract] [PDF]  

Jing Zhu, Shang-Peng Gao, Ai-Hua Zhang, and Jun Yuan

Theoretical electron energy-loss spectroscopy and its application in materials research
J Electron Microsc (Tokyo) 2005 0: 411; doi:10.1093/jmicro/dfi041 [Abstract] [PDF]  

F. Hüe, C. L. Johnson, S. Lartigue-Korinek, G. Wang, P. R. Buseck, and M. J. Hÿtch

Calibration of projector lens distortions
J Electron Microsc (Tokyo) 2005 0: 421; doi:10.1093/jmicro/dfi042 [Abstract] [PDF]  

Ludk Frank

Noise in secondary electron emission: the low yield case
J Electron Microsc (Tokyo) 2005 0: 441; doi:10.1093/jmicro/dfi044 [Abstract] [PDF]  

Lian-Mao Peng

Electron atomic scattering factors, Debye-Waller factors and the optical potential for high-energy electron diffraction
J Electron Microsc (Tokyo) 2005 0: 451; doi:10.1093/jmicro/dfi045 [Abstract] [PDF]  

Shin Fujita and Hiroshi Shimoyama

Theory of cathode trajectory characterization by canonical mapping transformation
J Electron Microsc (Tokyo) 2005 0: 521; doi:10.1093/jmicro/dfi052 [Abstract] [PDF]  

Biological note:

Michael W. Frohlich

A simple, cheap, one-minute method to mount insect pins for use as sharp-tipped probes in plant dissection
J Electron Microsc (Tokyo) 2005 0: 511; doi:10.1093/jmicro/dfi051 [Abstract] [PDF]  

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