Journal of Electron Microscopy

REVIEWS:

C. COLLIEX, T. MANOUBI, and O. L. KRIVANEK

EELS in the Electron Microscope: A Review of Present Trends
J Electron Microsc (Tokyo) 1986 35: 307-313. [Abstract] [PDF] [Request Permissions]  

Michiyoshi TANAKA

Conventional Transmission-Electron-Microscopy Techniques in Convergent-Beam Electron Diffraction
J Electron Microsc (Tokyo) 1986 35: 314-323. [Abstract] [PDF] [Request Permissions]  

FULL-LENGTH PAPERS:

Zenji HORITA, Takeshi SANO, and Minoru NEMOTO

Determination of the Absorption-Free k_ANi Factors for Quantitative Microanalysis of Nickel Base Alloys
J Electron Microsc (Tokyo) 1986 35: 324-334. [Abstract] [PDF] [Request Permissions]  

Seiichi SUZUKI and Hiroyuki KITAJIMA

Energy Dispersive X-Ray Spectroscopy in Medium Voltage Electron Microscope
J Electron Microsc (Tokyo) 1986 35: 335-342. [Abstract] [PDF] [Request Permissions]  

Kazuo ISHIZUKA, Hiroki KURATA, Takashi KOBAYASHI, and Natsu UYEDA

Quantitative Electron Energy Loss Spectroscopy Based on Microcomputer
J Electron Microsc (Tokyo) 1986 35: 343-352. [Abstract] [PDF] [Request Permissions]  

Tetsuo OIKAWA, Nobumasa SHIBATA, Kazunari NAKANISHI, Yasushi KOKUBO, and Yoshio BANDO

An EELS Spectrometer with a Double Dispersion Lens for a Medium Voltage TEM
J Electron Microsc (Tokyo) 1986 35: 353-358. [Abstract] [PDF] [Request Permissions]  

Yoshitsugu TOMOKIYO, Syo MATSUMURA, Noriyuki KUWANO, Masanori KOMINAMI, Tetsuya OKUYAMA, and Kensuke OKI

Application of Higher Order Laue Zone Patterns to Lattice Parameter Determination in Cu-based Alloys
J Electron Microsc (Tokyo) 1986 35: 359-364. [Abstract] [PDF] [Request Permissions]  

Yasuhiro GOTO, Hiroyasu OHTA, Katsutoshi KOMEYA, and Takao FUJIKAWA

Silicon Nitride Grain-Boundary Alteration by Capsule-Free Hot Isostatic Pressing (HIP)
J Electron Microsc (Tokyo) 1986 35: 365-370. [Abstract] [PDF] [Request Permissions]  

Yoshio BANDO, Mamoru MITOMO, and Yoshizo KITAMI

Grain Boundary Analysis of Silicon Nitrides by 400 kV Analytical Electron Microscopy
J Electron Microsc (Tokyo) 1986 35: 371-377. [Abstract] [PDF] [Request Permissions]  

Kotaro KURODA, Takeo KAMINO, and Toru IMURA

Microstructural and Microchemical Characterization of Intergranular Phase in Yttria-Doped Hot-Pressed Silicon Nitride
J Electron Microsc (Tokyo) 1986 35: 378-383. [Abstract] [PDF] [Request Permissions]  

Masao KITAMURA, Hiroshi ISOBE, Seiko WATANABE, and Nobuo MORIMOTO

Analytical Transmission Electron Microscopy of the Allende Meteorite
J Electron Microsc (Tokyo) 1986 35: 384-394. [Abstract] [PDF] [Request Permissions]  

Yoshio MATSUI, Yoshio BANDO, Yoshizo KITAMI, and John L. HUTCHISON

High Resolution TEM Study on Electron Beam-Induced Damage in Sodium ß'''-Alumina (Na₂ 4MgO 15Al₂O₃) and Isostructural Potassium ß'''-Ferrite (K₂O 4FeO 15Fe₂O₃
J Electron Microsc (Tokyo) 1986 35: 395-408. [Abstract] [PDF] [Request Permissions]  

Daisuke SHINDO, Makoto HIRABAYASHI, Takeshi KAWABATA, and Michio KIKUCHI

A Channelling Enhanced Microanalysis on Niobium Atom Location in an Al-43%Ti-2%Nb Intermetallic Compound
J Electron Microsc (Tokyo) 1986 35: 409-414. [Abstract] [PDF] [Request Permissions]  

Somei OHNUKI, Heishichiro TAKAHASHI, and Ryukichi NAGASAKI

Detection of Grain Boundary Segregation in Electron-Irradiated Fe-P Alloy by Means of Analytical Microscopy
J Electron Microsc (Tokyo) 1986 35: 415-421. [Abstract] [PDF] [Request Permissions]  

LETTERS:

Michio HIBINO and Itsuki HAYASHI

High Voltage Electron Energy Loss Spectroscopy Evaluated from Signal to Noise Ratio
J Electron Microsc (Tokyo) 1986 35: 422-425. [Abstract] [PDF] [Request Permissions]  

Takeshi TOMITA and Yoshiyasu HARADA

A New Condenser System for Convergent-beam Electron Diffraction
J Electron Microsc (Tokyo) 1986 35: 426-429. [Abstract] [PDF] [Request Permissions]  

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