Journal of Electron Microscopy

Special Issue: High Technology Material-3 Full-length Papers:

Michiyoshi Tanaka, Masami Terauchi, and Toshikatsu Kaneyama

Identification of Lattice Defects by Convergent-Beam Electron Diffraction
J Electron Microsc (Tokyo) 1991 40: 211-220. [Abstract] [PDF] [Request Permissions]  

Yoshio Matsui, Fujio Izumi, Yuh Yamada, Takehiko Matsumoto, Yasuharu Kodama, Shozo Ikeda, Kasumi Yanagisawa, and Shigeo Horiuchi

High-Resolution Transmission Electron Microscopy of Planar Defects in Ca-Doped YBCO/(l–2–4) High-T_c Superconductors Y_1–x Ca_xBa₂Cu₄O_y (x = 0 to 0.1)
J Electron Microsc (Tokyo) 1991 40: 221-228. [Abstract] [PDF] [Request Permissions]  

Kenzaburo Marukawa

Double Image of a Dislocation and Its Use for the Burgers Vector Identification in Anisotropic Materials
J Electron Microsc (Tokyo) 1991 40: 229-233. [Abstract] [PDF] [Request Permissions]  

Abstract:

The Forty-seventh Annual Meeting of the Japanese Society of Electron Microscopy
J Electron Microsc (Tokyo) 1991 40: 234-300. [PDF] [Request Permissions]  

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